This paper presents novel Built In Sensor (BIS) to test a well-known analog building block; the Current Feedback Operational Amplifier (CFOA). The proposed BIS tests on the terminal characteristics of the analog block. It has no voltage degradation. Moreover, it has a simple design, very small area and can detect both short and open circuit faults. Simulations are made to test CFOA-based universal analog filter. A comparison with the conventional IDDQ test is given and it proves that the proposed BIS has a superior performance. © 2009 IEEE.
Ahmed R.F., Madian A.H., Radwan A.G., Soliman A.M.
Analog test; BICS; Design for testability
Proceedings of the International Conference on Microelectronics, ICM, Art. No. 5696155, PP. 339 to 342, Doi: 10.1109/ICM.2010.5696155